Replace wrong compatibility strings for max14906 and max14916.
Fix wrong addressees for max14906 and max14916.
Signed-off-by: Stoyan Bogdanov <sbogdanov@baylibre.com>
Update the default memory maps for `nrf54h20dk` and `nrf9280pdk` to
remove the `shared_ram20_region` and `shared_ram3x_region` nodes,
because their child nodes no longer need to be grouped together:
* IPC buffers in RAM20 are statically allocated.
* DMA buffers in RAM3x have separate access owners.
Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
Apply the following changes to `nrf54h20dk` and `nrf9280pdk`:
* Convert `perm-*` properties to the newly introduced `nordic,access`,
both in board files and tests.
* Redefine shared regions to specify multiple access owners per node,
and ensure that each such region is reserved by one domain at a time.
`cpuapp_cpurad_ram0x_region` is only enabled by Radiocore, while
`cpuapp_cpucell_ram0x_region` is only enabled by Application core.
* Divide `shared_ram3x_region` so that each sub-region is owned by a
different domain. Their addresses must be rounded down to fit the
current UICR format.
Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
Fixed incorrect I2C register definitions in the test file
tests/drivers/build_all/sensor/i2c.dtsi.
Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
TI tmp1075 driver implemented based on tmp108 driver.
The driver initializes the sensor based on the DTS.
Added tmp1075 example overlay file to thermometer sample.
All you need to do to use the sensor is to connect the I2C and
optionally interrupt line.
To see default DTS configuration option inspect `ti,tmp1075.yaml`
bindings file and sensor spec.
Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
Change the unit of the sense resistor in the devicetree binding from
micro-ohms to milli-ohms. This is done for three reasons.
Firstly, the maximum value resistor that can currently be represented
is 4.2 kOhms, due to the limitation of devicetree properties to 32 bits.
Secondly, storing the resistance at such a high resolution makes
overflows much more likely when the desired output unit is micro-amps,
not milli-amps.
Finally, micro-ohms, are an unnecessarily precise unit for the purpose
of these calculations, and a resolution that is not realistic to
achieve. The high resistor resolution results in large divisors that
reduce the resolution of outputs. Unlike resistors characterised down to
the micro-ohm, devices wanting to measure micro-amps are actually
realistic.
Signed-off-by: Jordan Yates <jordan@embeint.com>
Add comparator build_all test suite designed to test multiple
devicetree overlays and boards for each comparator device driver.
Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
Industrial 8 channel output with advanced diagnostics.
Allowing giagnostic configuration both on per channel or global bases
In SPI communication diagnostic status transmitted on every
READ/WRITE which includes generic status of chip.
Diagnostics includes :
* Oveload
* Open Wire
* Over current
* Short to VDD
* Thermal Shutdown
* VDD Warn
* Watch Dog Error
* Communication Error
* VDD under voltage
Add app.overlay for MAX14916 driver.
Tested with adopted basic/blinky example.
Signed-off-by: Stoyan Bogdanov <sbogdanov@baylibre.com>
MAX14906 in 4 channel I/O with advanced diagnostic.
In SPI communication diagnostic status transmitted on every
READ/WRITE which includes generic status of chip.
Configuration both on global level and on per channel bases.
Diagnostics includes :
* Thermal overload
* current limit
* open wire detection
* short to VDD
* Above VDD
* Safe DEmagnitization fault
* VDD warning
* VDD low
* SPI/CRC Error
* WDog Error
* Loss GND
Add app.overlay for MAX14906 driver.
Tested with adopted basic/button and basic/blinky sample.
Signed-off-by: Stoyan Bogdanov <sbogdanov@baylibre.com>
test_flash_erase() requires that the expected[] array contains
pseudo-random data. However, the expected[] array would only
be initialized once before all tests are run using the setup
callback.
Instead, use the before() callback to randomize data before
each test in the suite, since there is otherwise no guarantee
that test_flash_erase() will be run directly after the
expected[] array has been randomized.
Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
Some counter drivers do not support alarms, so I added testcase which
starts the counter, checks if the value is in range after certain time and
stops the counter, to check if the counter is running correctly.
Signed-off-by: Krystof Sadlik <krystof.sadlik@nxp.com>
Co-authored-by: Michal Smola <michal.smola@nxp.com>
When PM_DEVICE_SYSTEM_MANAGED is enabled (and that's the default) all
devices are suspended when device go to idle state (through pm
subsystem and not through just cpu_idle). In this test we are manually
controlling PM of the DUT so we don't want that.
Additionally, suspend action is taking a semaphore and it is illegal
in idle thread (where system managment operates) which causes assert
in kernel scheduler.
Removed for nrf54h20 as it applies only there.
Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
- Implement irq-set-affinity in RISCV PLIC.
- Added new affinity shell command to get/set the irq(s)
affinity in runtime, when `0` is sent as the `local_irq`, it
means set/get all IRQs affinity.
- Some minor optimizations
Updated the build_all test to build this new configuration.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
Updated overlay files to test using nocache.
and run outside of usersapce mode to avoid
inaccessible memory regions when using nocache on RT parts.
Also updated testcase file to reflect nocache testing.
Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
This region is only required if certain fast peripherals make use of such
region for DMAing. It was now enabled on all builds, often resulting in:
```
[134/134] Linking C executable zephyr/zephyr.elf
Memory region Used Size Region Size %age Used
FLASH: 24372 B 248 KB 9.60%
RAM: 4448 B 256 KB 1.70%
DMA_RAM21: 0 GB 16 KB 0.00% <~~ Not used!
DMA_RAM3x_APP: 40 B 4 KB 0.98%
IDT_LIST: 0 GB 32 KB 0.00%
```
Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
- Exclude `app.overlay` from DTC_OVERLAY_FILES in
`drivers.gpio.build.adc_ads1145s0x_gpio` tests to avoid duplicate builds.
- Modified so that adc_ads1145s0x_gpio.overlay can be tested alone.
- Delete the conffile and move its contents to extra_configs.
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
The following devices enable TRIGGER in a way that is different from the
template definition, so add these settings to sensos_no_default.conf.
- bosch,bmc150
- bosch,bmm150
- bosch,bmp150
- ti,ina230
- we,wsen-itds
- lm77
- st,lsm9ds0-gyro
- ti,tmag5170
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
-add nucleo_u083rc and stm32u083c_dk overlays files
for testbench purpose.
- add platform_exclude property to skip test on boards
with little ram size.
Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
tests: drivers: adc: adc_api: update adc_api test
Test did not support PPR core due to failing GRTC channel allocation.
This change fixes the channel allocation and enables PPR core test.
Signed-off-by: Bartosz Miller <bartosz.miller@nordicsemi.no>
Align all existing samples/tests/applications which
contains nrf54l15pdk/nrf54l15/* by adding
nrf54l15dk/nrf54l15/* to enable twister builds.
Signed-off-by: Katarzyna Giądła <katarzyna.giadla@nordicsemi.no>
Signed-off-by: Grzegorz Chwierut <grzegorz.chwierut@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Note: Some drivers tests for which there is native specific driver
which will or may be built differently in native_sim and native_posix
have been left enabled for native_posix
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is now deprecated.
Building these tests in both native_sim and native_posix does not
improve coverage for the tests or subsystem but doubles CI time.
As anyhow native_posix will be removed all together in
2 releases, let's remove it already for these.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Drop the array dasignators as they generate a
warning: array designators are a C99 extension
warning when compiling with clang. Not too sure if this is an actual
problem or if the warning should be disabled instead but since it's just
a test it should be fine to just drop them.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
Fix the compiler error:
comparison of integer expressions of different signedness: ‘const int’
and ‘unsigned int’
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
The TLC5971_STRIP config enables if the "ti,tlc5971" node exists.
Also, removing the setting that explicitly enables in the
`tests/drivers/build_all/led_strip` test.
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
The Buffer data was being stored in cacheable memory for
the MIMXRT1010_EVK, the caching is not handle in these
test and cause mimxrt1010 to fail, this commit moves the
memory region to DTCM and in some cases lowers the size
of the DATA Buffer since it won't fit in DTCM for MIMXRT1010_EVK
Signed-off-by: Emilio Benavente <emilio.benavente@nxp.com>
1. kenistis dspi does support rx and tx with different size,
so skip the tx_bigger test.
2. dspi dma need internal alignment and 8192 bytes are too
many for k64, so reduce to 1440 bytes
fixing: #77010
Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
The native_sim has already been added to the test cases of
`drivers.ieee802154.build.external` is not being appropriately
processed because there is no corresponding overlay.
Create an overlay as an alias of native_posix.overlay.
Also, add the native_sim/native/64 platforms in the same way.
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
Use `test_adc` in io-channels to be consistent in whole
tests/drivers/build_all/sensor/adc.dtsi file.
Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
Fix warnings caught by running west build. Another fix will have to go
in to see why twister was missing these.
#78348
Signed-off-by: Yuval Peress <peress@google.com>
-add nucleo_u083rc and stm32u083c_dk boards for testbench purpose.
- add min_ram property to skip test on boards with little ram size.
Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
The test_target_position test used a stack allocated `poll_signal` which is
kept as a refrence inside the gpio driver. Since the time for polling the
signal was chosen pretty narrow, the function exited with the driver still
trying to signal the stack allocated value upon movement completion.
Fix by adding the structs to the test fixture and increase the timeout.
Resolves#78466.
Signed-off-by: Fabian Blatz <fabianblatz@gmail.com>
Allow IRQs to work on every hart regardless of the mapping
of the contexts.
Add a test to validate the hart-context mapping.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
Verify NRF GPIO driver with NRFX interrupts disabled.
Verify that driver handles properly 'get' and 'set' api methods.
When calling interrupt enable driver should report
'function not implemented' error.
Signed-off-by: Bartosz Miller <bartosz.miller@nordicsemi.no>
Install the second instance to 0x8(uei), because MSI is installed
to 0x3(msi) when SMP is enabled.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
using arduino header to simplify test settings.
arduino_header D2 and D3 can be used by default.
alt: 118 platforms are enabled for this test.
Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
- add overlays and kconfigs files for nucleo_u083rc and
stm32u083c_dk boards.
- update testcase.yaml for CI
Signed-off-by: Fabrice DJIATSA <fabrice.djiatsa-ext@st.com>
This allows to run the test 'chan_blen_transfer' and 'loop_transfer' on
the sim3u1xx_dk board.
The functionality tested in `chan_link_transfer` and `scatter_gather` is
not (yet) supported by the Si32 DMA driver, and those tests therefore
not enabled.
Signed-off-by: Reto Schneider <reto.schneider@husqvarnagroup.com>
Fix flexspi xip configuration issue regarding code relocation
due to the order of kconfig defaults being sourced
The flexspi setup was not being relocated to an on chip location
Also remove rt1060 conf file in flash common test which changes the
code relocation location to RAM, just keep as ITCM for all M7 which
as of now all have ITCM from NXP with flexspi.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Add support for flashing the Adafruit Feather nrf52840 Express
using UF2 over USB.
Also standardise on using the UF2 variant, so add a non UF2 variant
of the Sense board, so it can be flashed using the SWD headers.
Created flash dtsi files for both SWD and UF2. These are actually identical
for many other boards and should probably be moved to common in future.
Signed-off-by: Jacob Winther <jacob@9.nz>
Update both versions of adafruit feather nrf52840 to be variants rather
than separate boards. The aim is to provide a more consistent approach
and to remove some unnecessary Kconfig redundancy.
Signed-off-by: Jacob Winther <jacob@9.nz>
Define DMA channels for MAX32 boards and add a new test case so that
DMA-based SPI transfers are tested.
Signed-off-by: Tahsin Mutlugun <Tahsin.Mutlugun@analog.com>
Add all the necessary files to add apds9253 Avago sensor driver.
Sensor available at https://docs.broadcom.com/doc/APDS-9253-001-DS
Signed-off-by: Margherita Milani <margherita.milani@amarulasolutions.com>
Signed-off-by: Michael Trimarchi <michael@amarulasolutions.com>
- Update `MAX_IRQ_PER_AGGREGATOR` to 1024 to match with the
devicetree
- Update `2ND_LEVEL_INTERRUPT_BITS` to 11 bits to
be able to encode the L2 IRQs.
- Update `NUM_IRQS` to 1036 (L1 has 12, L2 has 1024)
Update the `MAX_IRQ_PER_AGGREGATOR` config in testcase
accordingly, so that it won't overflow the configured bits.
Signed-off-by: Yong Cong Sin <ycsin@meta.com>
Signed-off-by: Yong Cong Sin <yongcong.sin@gmail.com>
Add test which validates behavior of the UART driver when there
are errors on the receiver line.
Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
This commit removes the `hifive1` board from the `platform_exclude` list
for the `drivers.gpio.1pin` pin.
The root cause for why this platform was disabled was fixed in the recent
Renode version upgrade in the CI image.
Fixes#69350.
Signed-off-by: Filip Kokosinski <fkokosinski@antmicro.com>
The linear battery charger will charge the connected battery up
to a specific voltage. This is different depending on the chemistry
of the battery. Most LiPo Batteries have a nominal voltage of 4.2V,
which is why the default voltage of the bq25180 is 4.2V.
Signed-off-by: Fabian Pflug <fabian.pflug@grandcentrix.net>
Gerard Marull-Paretas