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zephyr/tests/drivers
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Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering 
We have many testcases doing filtering both on the architecture level
and the platform level, which is redundant. Also many testcases are
running the same test twice on the same SoC for no good reason, cleanup
the tests and cleanup the filtering.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
 		2017-06-27 17:44:23 -04:00
..
adc tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
aio/aio_basic_api tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
aon_counter/aon_api tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
build_all tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
dma tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
enc28j60 tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
gpio/gpio_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
i2c/i2c_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
ipm tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
nsim_uart tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
pci_enum tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
pinmux/pinmux_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
pwm/pwm_api tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
quark_clock tests: remove testcase.ini files 2017-06-21 20:56:53 -04:00
rtc/rtc_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
spi/spi_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
uart/uart_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00
watchdog/wdt_basic_api tests: samples: remove duplicate filtering 2017-06-27 17:44:23 -04:00