Anas Nashif bc672895ba tests: remove duplicate tests ... Remove a few duplicates and avoid calling tests multiple times for setup/teardown. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2018-05-07 12:27:07 -04:00
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aes	tests: crypto: aes: use meaningful test names	2018-02-18 09:16:40 -05:00
cbc_mode	tests: crypto: style, tag, and category fixes	2018-04-25 14:18:15 +05:30
ccm_mode	tests: crypto: stop relying on path for naming	2018-02-18 09:16:40 -05:00
cmac_mode	tests: crypto: stop relying on path for naming	2018-02-18 09:16:40 -05:00
ctr_mode	tests: crypto: style, tag, and category fixes	2018-04-25 14:18:15 +05:30
ctr_prng	tests: crypto: stop relying on path for naming	2018-02-18 09:16:40 -05:00
ecc_dh	tests: add min_flash option for some tests	2018-04-10 10:07:18 -05:00
ecc_dsa	tests: add min_flash option for some tests	2018-04-10 10:07:18 -05:00
hmac	tests: crypto: style, tag, and category fixes	2018-04-25 14:18:15 +05:30
hmac_prng	tests: crypto: stop relying on path for naming	2018-02-18 09:16:40 -05:00
mbedtls	tests: crypto: mbedtls: enabled test for esp32	2018-03-09 21:29:08 -05:00
rand32	tests: crypto: rand32: move rand32 test out of kernel	2018-03-23 07:29:18 -04:00
sha256	tests: remove duplicate tests	2018-05-07 12:27:07 -04:00