3c50f7aa12
We have many testcases doing filtering both on the architecture level and the platform level, which is redundant. Also many testcases are running the same test twice on the same SoC for no good reason, cleanup the tests and cleanup the filtering. Signed-off-by: Anas Nashif <anas.nashif@intel.com> |
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| src | ||
| Makefile | ||
| README | ||
| prj.conf | ||
| sample.yaml | ||
README
This is a sample app to read and write the Fujitsu MB85RC256V FRAM chip via I2C on the Quark SE Sensor Subsystem. This assumes the slave address of FRAM is 0x50, where A0, A1, and A2 are all tied to ground.