zephyr

History

Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering We have many testcases doing filtering both on the architecture level and the platform level, which is redundant. Also many testcases are running the same test twice on the same SoC for no good reason, cleanup the tests and cleanup the filtering. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2017-06-27 17:44:23 -04:00
..
src	samples: convert to using newly introduced integer sized types	2017-04-21 09:53:53 -05:00
Makefile	samples: tests: remove obsolete KERNEL_TYPE and kernel variables	2016-11-04 15:47:25 -04:00
README	move driver samples to samples/drivers	2016-02-11 13:08:44 -05:00
prj.conf	i2c: unify kconfig options and share them across drivers	2016-05-12 10:57:22 +00:00
sample.yaml	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00

README

This is a sample app to interface with
TI INA219 power monitor. The values
used in the app are for use on Adafruit's
breakout board
(https://www.adafruit.com/products/904).

This assumes the slave address is 0x40,
where A0 and A1 are all tied to ground.