zephyr/tests/drivers/gpio/gpio_basic_api
Enjia Mai 4c9faf95ef tests: driver: gpio: fix the incorrect testsuite names
There are some erros in previous ztest API migration of
the gpio_basic_api tests. Fix the incorrect testsuite
name of the callback mgmt and vari tests.

Fixes: #49953

Signed-off-by: Enjia Mai <enjia.mai@intel.com>
2022-09-19 09:34:36 +00:00
..
boards tests: Remove label property from devicetree overlays 2022-07-28 20:52:20 +02:00
dts/bindings
src tests: driver: gpio: fix the incorrect testsuite names 2022-09-19 09:34:36 +00:00
CMakeLists.txt
README.txt
prj.conf tests: drivers: gpio: move the gpio basic test to new ztest API 2022-08-29 10:31:45 +02:00
testcase.yaml

README.txt

GPIO 2-Pin Test
###############

This application tests the GPIO subsystem using a hardware configuration
where two GPIOs are directly wired together.  The test pins are
identified through a test-specific devicetree binding in the `dts/`
subdirectory, implemented for specific boards by overlay files in the
`boards/` directory.

For some boards `src/main.c` may also need to be extended to configure
the selected pins for use as GPIOs.

Only boards for which an overlay is present can pass this test.  Boards
without an overlay, or for which the required wiring is not provided,
will fail with an error like this:

    Validate device GPIO_0
    Check GPIO_0 output 2 connected to input 3
    FATAL output pin not wired to input pin? (out high => in low)

No special build options are required to make use of the overlay.