Johan Hedberg 30beef9419 Bluetooth: GATT Introduce BT_GATT_CCC_MAX helper define ... The worst-case maximum number of CCC entries we need is actually MAX_CONN + MAX_PAIRED. Provide a helper define for it and use it whenever appropriate. Signed-off-by: Johan Hedberg <johan.hedberg@intel.com>		2017-07-04 17:30:40 +03:00
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benchmarks	tests: boot_time: cleanup boot_time test to work on ARM	2017-06-29 07:08:59 -04:00
bluetooth	Bluetooth: GATT Introduce BT_GATT_CCC_MAX helper define	2017-07-04 17:30:40 +03:00
booting/stub	license: Replace Apache boilerplate with SPDX tag	2017-01-19 03:50:58 +00:00
compliance	tests/compiance/checkpatch: force the format to 'email'	2016-11-10 19:30:32 +00:00
crypto	tests: crypto: include back riscv32 arch for ecc_dh, ecc_dsa and mbedtls	2017-06-30 06:31:51 -04:00
drivers	tests: Remove camel case and fix coding style	2017-06-29 07:00:50 -04:00
include	tests: convert to using newly introduced integer sized types	2017-04-21 09:53:49 -05:00
kernel	tests: tickless: fix building of test	2017-06-29 13:14:18 -05:00
lib/json	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
net	tests/ieee802154: Fix how is initialized the driver lock in l2 test	2017-07-03 20:58:57 -04:00
power	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
shell	tests: shell: Filter on UART_CONSOLE support to enable more boards	2017-06-29 07:07:31 -04:00
subsys	tests: Remove camel case and fix coding style	2017-06-29 07:00:50 -04:00
unit	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
ztest	tests/ztest: Add ztest_test_pass()	2017-06-21 21:52:50 -04:00
Kconfig	tests: Introduced new config option to add extra stack size for tests.	2017-02-13 11:39:03 -08:00
Makefile	tests: Add a generic testing framework	2016-09-30 21:17:39 +00:00
Makefile.test	tests: Add a generic testing framework	2016-09-30 21:17:39 +00:00