79e6b0e0f6
As of today <zephyr/zephyr.h> is 100% equivalent to <zephyr/kernel.h>. This patch proposes to then include <zephyr/kernel.h> instead of <zephyr/zephyr.h> since it is more clear that you are including the Kernel APIs and (probably) nothing else. <zephyr/zephyr.h> sounds like a catch-all header that may be confusing. Most applications need to include a bunch of other things to compile, e.g. driver headers or subsystem headers like BT, logging, etc. The idea of a catch-all header in Zephyr is probably not feasible anyway. Reason is that Zephyr is not a library, like it could be for example `libpython`. Zephyr provides many utilities nowadays: a kernel, drivers, subsystems, etc and things will likely grow. A catch-all header would be massive, difficult to keep up-to-date. It is also likely that an application will only build a small subset. Note that subsystem-level headers may use a catch-all approach to make things easier, though. NOTE: This patch is **NOT** removing the header, just removing its usage in-tree. I'd advocate for its deprecation (add a #warning on it), but I understand many people will have concerns. Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no> |
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CMakeLists.txt | ||
README.txt | ||
prj.conf | ||
testcase.yaml |
README.txt
SDMMC Subsystem Test ################## This test is designed to verify the SD subsystem stack implementation, and run stress tests to verify large data transfers succeed using the subsystem. Due to the differences between underlying SD host controller drivers, this test also serves as a complete test for the SDHC driver implementation in use. It requires an SD card be connected to the board to pass, and will perform destructive I/O on the card, wiping any data present. The test has the following phases: * Init test: verify the SD host controller can detect card presence, and test the initialization flow of the SDMMC subsystem to verify that the stack can correctly initialize an SD card. * IOCTL test: verify the SD subsystem correctly implements IOCTL calls required for block devices in Zephyr. * Read test: verify that single block reads work, followed by multiple block reads. Ensure the subsystem will reject reads beyond the end of the card's stated size. * Write test: verify that single block writes work, followed by multiple block writes. Ensure the subsystem will reject writes beyond the end of the card's stated size. * R/W test: write data to the SD card, and verify that it is able to be read back without error. Perform this R/W combination at several sector locations across the SD card.