zephyr/tests/subsys/sd/sdmmc
Gerard Marull-Paretas 79e6b0e0f6 includes: prefer <zephyr/kernel.h> over <zephyr/zephyr.h>
As of today <zephyr/zephyr.h> is 100% equivalent to <zephyr/kernel.h>.
This patch proposes to then include <zephyr/kernel.h> instead of
<zephyr/zephyr.h> since it is more clear that you are including the
Kernel APIs and (probably) nothing else. <zephyr/zephyr.h> sounds like a
catch-all header that may be confusing. Most applications need to
include a bunch of other things to compile, e.g. driver headers or
subsystem headers like BT, logging, etc.

The idea of a catch-all header in Zephyr is probably not feasible
anyway. Reason is that Zephyr is not a library, like it could be for
example `libpython`. Zephyr provides many utilities nowadays: a kernel,
drivers, subsystems, etc and things will likely grow. A catch-all header
would be massive, difficult to keep up-to-date. It is also likely that
an application will only build a small subset. Note that subsystem-level
headers may use a catch-all approach to make things easier, though.

NOTE: This patch is **NOT** removing the header, just removing its usage
in-tree. I'd advocate for its deprecation (add a #warning on it), but I
understand many people will have concerns.

Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
2022-09-05 16:31:47 +02:00
..
src includes: prefer <zephyr/kernel.h> over <zephyr/zephyr.h> 2022-09-05 16:31:47 +02:00
CMakeLists.txt
README.txt
prj.conf
testcase.yaml tests: subsys: sd: sdmmc: Convert to use DEVICE_DT_GET 2022-07-14 10:29:14 +02:00

README.txt

SDMMC Subsystem Test
##################

This test is designed to verify the SD subsystem stack implementation,
and run stress tests to verify large data transfers succeed using the
subsystem. Due to the differences between underlying SD host controller drivers,
this test also serves as a complete test for the SDHC driver implementation in
use. It requires an SD card be connected to the board to pass, and will
perform destructive I/O on the card, wiping any data present. The test has
the following phases:

* Init test: verify the SD host controller can detect card presence, and
  test the initialization flow of the SDMMC subsystem to verify that the stack
  can correctly initialize an SD card.

* IOCTL test: verify the SD subsystem correctly implements IOCTL calls required
  for block devices in Zephyr.

* Read test: verify that single block reads work, followed by multiple
  block reads. Ensure the subsystem will reject reads beyond the end of
  the card's stated size.

* Write test: verify that single block writes work, followed by multiple
  block writes. Ensure the subsystem will reject writes beyond the end of
  the card's stated size.

* R/W test: write data to the SD card, and verify that it is able
  to be read back without error. Perform this R/W combination at several
  sector locations across the SD card.