67 lines
2.4 KiB
ReStructuredText
67 lines
2.4 KiB
ReStructuredText
.. _spi_flash_at45_sample:
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AT45 DataFlash driver sample
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#############################
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Overview
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********
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This sample shows how to use the AT45 family DataFlash driver and how to
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specify devicetree nodes that enable flash chip instances to be handled
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by the driver (an overlay with two sample nodes is provided).
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The sample writes a defined test region in the flash memory with bytes of
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increasing (and overflowing at the 8-bit range) values and then reads it back
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to check if the write was successful. The starting value is also increased
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in consecutive runs of the sample. Finally, the flash chip is put into low
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power state.
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In the default configuration, the AT45 flash driver is configured to use
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the Read-Modify-Write functionality of DataFlash chips and does not perform
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page erasing, as it is not needed in this case. This can be modified by
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simply disabling the SPI_FLASH_AT45_USE_READ_MODIFY_WRITE option.
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Requirements
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************
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This sample has been tested on the Nordic Semiconductor nRF9160 DK
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(nrf9160dk_nrf9160) board with the AT45DB321E chip connected.
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It can be easily adjusted to be usable on other boards and with other
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AT45 family chips by just providing a corresponding overlay file.
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Building and Running
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********************
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The code can be found in :zephyr_file:`samples/drivers/spi_flash_at45`.
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To build and flash the application:
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.. zephyr-app-commands::
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:zephyr-app: samples/drivers/spi_flash_at45
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:board: nrf9160dk_nrf9160
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:goals: build flash
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:compact:
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Sample Output
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=============
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.. code-block:: console
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DataFlash sample app on nrf9160dk_nrf9160
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Using DATAFLASH_1, chip size: 4194304 bytes (page: 512)
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Reading the first byte of the test region ... OK
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Preparing test content starting with 0x01.
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Writing the first half of the test region... OK
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Writing the second half of the test region... OK
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Reading the whole test region... OK
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Checking the read content... OK
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Putting the flash device into low power state... OK
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The sample is supplied with the overlay file that specifies two instances
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of AT45 family chips but only the one labeled "DATAFLASH_1" is required
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for the sample to work. If the other chip is not connected, the following
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log message appears, but apart from that the behavior of the sample stays
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unaffected.
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.. code-block:: console
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[00:00:00.000,000] <err> spi_flash_at45: Wrong JEDEC ID: ff ff ff, expected: 1f 24 00
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