Anas Nashif 49bb83138c tests: classify periphera tests ... Fix testcase naming and follow <component>.<subcomponent> where it makes sense. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2018-04-09 22:55:20 -04:00
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adc	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
aio	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
aon_counter/aon_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
build_all	tests: drivers: build_all: add TEMP_NRF5 to sensor test	2018-04-04 14:53:54 -05:00
dma	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
entropy/api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
gpio/gpio_basic_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
i2c/i2c_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
i2s	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
ipm	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pci_enum	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pinmux/pinmux_basic_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
pwm/pwm_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
rtc/rtc_basic_api	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
spi/spi_loopback	tests: classify periphera tests	2018-04-09 22:55:20 -04:00
uart/uart_basic_api	tests: uart: fixed filtering and make test global	2017-12-28 20:24:29 -05:00
watchdog/wdt_basic_api	tests/samples: fixed yaml syntax	2017-12-11 14:47:08 -05:00