Anas Nashif c364e06ccb tests: move spi test under tests/ ... Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2017-07-05 12:43:13 -04:00
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aio_comparator	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
crypto	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
current_sensing	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
gpio	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
i2c_fujitsu_fram	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
lcd_hd44780	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
led_apa102c	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
random	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
rtc	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
soc_flash_nrf5	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
spi_flash	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00
spi_fujitsu_fram	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00
watchdog	tests: remove testcase.ini files	2017-06-21 20:56:53 -04:00