Kumar Gala b89a808b26 tests: subsys: settings: Use DT_FLASH_AREA_<FOO>_ID define ... Set Kconfig symbol SETTINGS_FCB_FLASH_AREA based on the DT_FLASH_AREA_<FOO>_ID define instead of being hard coded. We replace 3 with DT_FLASH_AREA_IMAGE_SCRATCH_ID and we replace 4 with DT_FLASH_AREA_STORAGE_ID. Signed-off-by: Kumar Gala <kumar.gala@linaro.org>		2019-02-07 10:31:27 -06:00
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dfu	tests: mcuboot: Erase image slot before starting test	2019-01-21 12:00:55 -05:00
fs	tests: subsys: fs: fcb: Use DT_FLASH_AREA_<FOO>_ID define	2019-02-07 10:31:27 -06:00
logging	tests: subsys: logging: Add log_output test suite	2019-01-29 17:24:37 +01:00
settings	tests: subsys: settings: Use DT_FLASH_AREA_<FOO>_ID define	2019-02-07 10:31:27 -06:00
storage/flash_map	tests/subsys/storage/flash_map: use auto-generated fa ID	2019-02-07 10:31:27 -06:00
usb	tests: usb: Include desc_sections test for native_posix	2019-02-06 17:53:04 -05:00