zephyr/tests
Swift Tian 74ddfbc8a2 tests: devicetree: Add a test test_child_nodes_number
The test uses DT_CHILD_NUM and DT_INST_CHILD_NUM to get the number of
child nodes of a given node from generated macro.
The test uses DT_CHILD_NUM_STATUS_OKAY and DT_INST_CHILD_NUM_STATUS_OKAY
to get the number of child nodes of a given node which children's status
are "okay" from generated macro.

Signed-off-by: Swift Tian <swift.tian@ambiq.com>
2024-05-03 11:18:43 +02:00
..
application_development
arch tests: arch: common: add stack_unwind test 2024-04-20 13:54:43 -04:00
benchmarks
bluetooth bluetooth: tester: Add support for OTS 2024-05-02 16:51:42 +02:00
boards driver: ssp: update Intel SSP DAI driver to support dynamic SSP management 2024-04-25 12:14:50 +02:00
boot test: mcuboot: enable test for rd_rw612_bga 2024-04-29 22:31:33 +01:00
bsim tests: bsim: Bluetooth: Fix sim_length for central_hr_peripheral_hr 2024-05-02 12:18:49 +01:00
cmake tests: cmake: overlays: Add soc_folder_overlay test 2024-04-29 15:08:35 +01:00
crypto
drivers tests: drivers: adc_api: support numaker_m2l31ki 2024-05-02 09:58:43 +01:00
kconfig/configdefault
kernel tests: thread abort deadlock scenario 2024-05-02 13:55:03 -04:00
lib tests: devicetree: Add a test test_child_nodes_number 2024-05-03 11:18:43 +02:00
misc linker: tests: Use Z_LINK_ITERABLE_SUBALIGN 2024-04-20 13:45:25 -04:00
modules
net tests: net: http_server: Add tests for the HTTP server 2024-04-30 13:25:22 +02:00
posix posix: Introduce getentropy() function 2024-04-29 11:46:06 +01:00
robot
subsys tests: subsys: lorawan: add channels mask configuration tests 2024-05-03 09:51:46 +02:00
unit
ztest
test_config.yaml