59 lines
1.6 KiB
YAML
59 lines
1.6 KiB
YAML
# Copyright (c) 2021 Nordic Semiconductor ASA
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# SPDX-License-Identifier: Apache-2.0
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description: |
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Test pin controller.
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compatible: "vnd,pinctrl-test"
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include: base.yaml
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child-binding:
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description: |
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Test pin controller pin configuration nodes. Each node is composed by one or
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more groups, each defining the configuration for a set of pins.
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child-binding:
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description: |
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Test pin controller pin configuration group. Each group contains a list of
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pins sharing the same set of properties. Example:
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/* node representing default state for test_device0 */
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test_device0_default: test_device0_default {
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/* group 1 (name is arbitrary) */
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group1 {
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/* configure pins 0 and 1 */
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pins = <0>, <1>;
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/* both pins 0 and 1 have pull-up enabled */
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bias-pull-up;
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};
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...
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/* group N (name is arbitrary) */
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groupN {
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/* configure pin M */
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pins = <M>;
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/* pin M has pull-down enabled */
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bias-pull-down;
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};
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};
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The list of supported standard properties:
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- bias-pull-up: Enable pull-up resistor.
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- bias-pull-down: Enable pull-down resistor.
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include:
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- name: pincfg-node.yaml
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property-allowlist:
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- bias-pull-down
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- bias-pull-up
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properties:
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pins:
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required: true
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type: array
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description: |
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An array of pins sharing the same group properties. Each entry is a
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32-bit integer that is just used to identify the entry for testing
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purposes.
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