70758c4374
The seasonal overhaul of test identifiers aligning the terms being used and creating a structure. This is hopefully the last time we do this, plan is to document the identifiers and enforce syntax. The end-goal is to be able to generate a testsuite description from the existing tests and sync it frequently with the testsuite in Testrail. Signed-off-by: Anas Nashif <anas.nashif@intel.com> |
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| CMakeLists.txt | ||
| README | ||
| prj.conf | ||
| sample.yaml | ||
README
This is a sample app to read and write the Fujitsu MB85RC256V FRAM chip via I2C on the Quark SE Sensor Subsystem. This assumes the slave address of FRAM is 0x50, where A0, A1, and A2 are all tied to ground.