zephyr/tests
Johann Fischer 1ac67d1559 tests: usb: adapt descriptor test to new Serial Number placeholder
Adapt descriptor test to new Serial Number placeholder.

Signed-off-by: Johann Fischer <j.fischer@phytec.de>
2019-12-18 11:12:28 +01:00
..
application_development tests: fix test identifiers 2019-12-09 15:53:44 -05:00
arch global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
benchmarks samples & tests: Correct main() type 2019-12-16 11:27:56 +01:00
bluetooth Bluetooth: controller: SW deferred privacy build test 2019-12-13 15:35:25 +01:00
boards tests: fix test identifiers 2019-12-09 15:53:44 -05:00
crypto global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
drivers drivers: clock_control: nrf: Switch to single clock device 2019-12-17 14:38:19 +01:00
kernel tests: no-multithreading: Disable networking 2019-12-18 10:35:15 +02:00
lib global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
misc/test_build tests: fix test identifiers 2019-12-09 15:53:44 -05:00
net samples & tests: Correct main() type 2019-12-16 11:27:56 +01:00
portability tests: samples: portability: fix test tags and identifiers 2019-12-09 15:53:44 -05:00
posix global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
shell tests: fix test identifiers 2019-12-09 15:53:44 -05:00
subsys tests: usb: adapt descriptor test to new Serial Number placeholder 2019-12-18 11:12:28 +01:00
unit global: Remove leading/trailing blank lines in files 2019-12-11 19:17:27 +01:00
ztest subsys/testsuite: make tc_util overridable 2019-09-17 07:11:33 +08:00