Anas Nashif 3c50f7aa12 tests: samples: remove duplicate filtering ... We have many testcases doing filtering both on the architecture level and the platform level, which is redundant. Also many testcases are running the same test twice on the same SoC for no good reason, cleanup the tests and cleanup the filtering. Signed-off-by: Anas Nashif <anas.nashif@intel.com>		2017-06-27 17:44:23 -04:00
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src	samples: convert to using newly introduced integer sized types	2017-04-21 09:53:53 -05:00
Makefile	samples: bmi160: use direct GPIO trigger instead of ipm	2016-12-16 15:56:33 +00:00
prj.conf	arduino_101: bmi160: use new device name	2017-02-10 16:02:22 +00:00
sample.yaml	tests: samples: remove duplicate filtering	2017-06-27 17:44:23 -04:00