zephyr/tests
Enjia Mai bd1d0b22b5 tests: ztest: fix error_hook test case fail in some board
Enlarge the test thread stack size, to fix test case fail
in some board which need more stack size for testing, when
CONFIG_EXCEPTION_DEBUG is enabled.

Signed-off-by: Enjia Mai <enjiax.mai@intel.com>
2021-02-04 13:09:55 -05:00
..
application_development tests: add filter for some tests using newlib 2020-12-16 08:57:40 -05:00
arch tests: arm: cortex_m: test dynamic lazy stacking on Cortex-m 2021-02-02 17:58:58 -05:00
benchmarks logging: Revamp menuconfig 2021-01-26 06:15:42 -05:00
bluetooth Bluetooth: controller: Fix BIG Sync Terminate command 2021-01-26 06:18:23 -05:00
boards i2c_test: add a testcase to test i2c api for microchip board 2021-01-23 01:34:10 -05:00
crypto tests/mbedtls: increase stack size 2021-01-15 13:06:33 -05:00
deprecated/inttype
drivers tests/drivers/dma: Enable tests on nucleo_f746zg and disco_l475_iot1 2021-02-04 12:35:04 -05:00
kernel tests/kernel/common: Skip the printk test when not applicable 2021-02-03 20:56:14 -05:00
lib libc/minimal: fix realloc() allocated memory alignment 2021-02-02 19:08:24 -05:00
misc/test_build
net net: coap: clean up token usage in samples and tests 2021-02-02 14:03:01 -05:00
portability samples: cmsis_rtos_v2: increase stack 2021-01-20 16:45:31 -05:00
posix tests: tls: add toolchain filter 2020-12-15 11:22:38 +01:00
subsys edac: Use Device Tree values for BDF and PCI VID 2021-02-04 09:37:42 -05:00
unit tests: unit: cbprintf: fix for filtered prototypes 2021-01-27 13:34:06 -05:00
ztest tests: ztest: fix error_hook test case fail in some board 2021-02-04 13:09:55 -05:00