..
adc
tests: enhance test meta-data/improve test naming
2018-05-07 12:27:07 -04:00
aio
tests: fixed doxygen comments
2018-04-30 17:15:29 -04:00
aon_counter /aon_api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
build_all
test_build_sensors_a_m: disable app memory
2018-05-22 15:59:07 -07:00
dma
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
entropy /api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
gpio /gpio_basic_api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
i2c /i2c_api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
i2s
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
ipm
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
pci_enum
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
pinmux /pinmux_basic_api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
pwm /pwm_api
tests: classify periphera tests
2018-04-09 22:55:20 -04:00
rtc /rtc_basic_api
tests: rtc: Adjust RTC samples tests for NXP RTC
2018-05-17 13:45:08 -05:00
spi /spi_loopback
tests: spi_loopback: Add frdm_kw41z configuration
2018-05-10 15:43:42 -05:00
uart /uart_basic_api
doc: tests: remove obsolete and bogus test groups
2018-05-18 01:48:31 +03:00
watchdog /wdt_basic_api
tests: watchdog: Replace platform whitelists with depends_on
2018-05-17 15:00:55 -05:00