Commit Graph

3684 Commits

Author SHA1 Message Date
Krzysztof Chruściński 949566f829 tests: drivers: spi: spi_controller_peripheral: Add nrf54h20dk cpuppr
Rework existing nrf54h20dk overlays to allow adding of
nrf54h20dk//cpuppr target.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-24 09:29:39 +02:00
Krzysztof Chruściński f20b595dfe tests: drivers: spi: loopback: Add nrf54h20dk cpuppr
Add configuration for nrf54h20dk//cpuppr target.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-24 09:29:39 +02:00
Krzysztof Chruściński 20c34ea092 tests: drivers: spi: spi_loopback: Add nrf54h20dk cpurad
Add overlay for nrf54h20dk cpurad.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-24 09:29:39 +02:00
Krzysztof Chruściński 614e7d5399 tests: drivers: spi: loopback: Configurable large buffer
In order to allow fiting test in targets with smaller memory make
large buffer configurable through Kconfig.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-24 09:29:39 +02:00
Bartlomiej Buczek dfbcea777a tests: drivers: adc_accuracy: add calibration before sampling
Calibrate adc before taking measurement.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek 557b5bda9a tests: drivers: adc_accuracy: parametrize expected accuracy
On nrf boards expected accuracy from ref voltage is 64 instead of 32.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek 008f8babac tests: drivers: adc_api: change second channel gain for nrf54.
It will increase test coverage for adc driver, no test uses
ADC_GAIN_2_3 setting yet.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek 108f6cdf3a tests: adc_accuracy: add overlay for nrf54l15dk.
Add overlay and enable test for nrf54l15dk.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek d4c8b358fa tests: adc_accuracy: Add overlay for nrf54h20dk.
Add overlay and enable test for nrf54h20dk.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek dc9a9dcf40 tests: adc_accuracy: Add overlay for nrf52840dk.
Add overlay and enable test for nrf52840dk.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:17 +02:00
Bartlomiej Buczek da81490034 tests: drivers: adc: add adc_error_cases tests.
Tests are checking error codes returned from adc_read() and
adc_channel_setup() used with invalid configurations.

Signed-off-by: Bartlomiej Buczek <bartlomiej.buczek@nordicsemi.no>
2024-10-23 17:02:07 +02:00
TOKITA Hiroshi 0845fbda7f tests: drivers: build_all: w1: Add `zephyr,w1-serial` to build test
Add configuration for `zephyr,w1-serial` to enable build test

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-23 16:54:15 +02:00
TOKITA Hiroshi 06eaf05bc8 tests: drivers: build_all: w1: Add i2c-devices build test
Add build tests for following devices.

- maxim,ds2482-800
- maxim,ds2484
- maxim,ds2485

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-23 16:54:15 +02:00
TOKITA Hiroshi 317405c01d tests: drivers: build_all: Add a build_all test for disk
The test targets the following devices at this time.

- zephyr,sdmmc-disk
- zephyr,mmc-disk

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-23 16:54:15 +02:00
TOKITA Hiroshi 60002865c7 tests: drivers: build_all: Add a build_all test for crypto
The test targets the following devices at this time.

- atmel,ataes132a

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-23 16:54:15 +02:00
Armando Visconti 5be36eef47 drivers/sensor: lps2xdf: add ilps22qs support
The ILPS22QS is an ultra-compact piezoresistive absolute pressure sensor
which functions as a digital output barometer, supporting dual full-scale
up to user- selectable 4060 hPa. The device delivers ultra-low pressure
noise with very low power consumption and operates over an extended
temperature range from -40 °C to +105 °C.

(https://www.st.com/en/mems-and-sensors/ilps22qs.html)

Signed-off-by: Armando Visconti <armando.visconti@st.com>
2024-10-23 16:52:57 +02:00
Karol Lasończyk 19252bdc3d tests: drivers: i2s: Add overlay to support nRF54L15 DK
Add overlay to support nRF54L15 DK.

Signed-off-by: Karol Lasończyk <karol.lasonczyk@nordicsemi.no>
2024-10-23 16:52:49 +02:00
Sebastian Głąb 8023a58c2a tests: drivers: can: api: Add negative test for can_send()
Check error codes when sending invalid frames:
- too big data payload;
- wrong set of flags.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-10-23 11:40:34 +02:00
Sebastian Głąb 2616720ee2 tests: drivers: can: api: Add negative test for can_set_bitrate_data()
There is negative test for too high data bitrate.
Add test that checks too low data bitrate.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-10-23 11:40:34 +02:00
Sebastian Głąb 13fbac86eb tests: drivers: can: api: Add negative test for can_set_bitrate()
There is negative test for too high bitrate.
Add test that checks too low bitrate.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-10-23 11:40:34 +02:00
Sebastian Głąb dbc8eaa535 tests: drivers: can: api: Add negative test for can_add_rx_filter()
Check that error is reported when CAN filter is added without
callback function.

Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
2024-10-23 11:40:34 +02:00
Swift Tian c9a1db6e7e tests: mspi: fix incorrect DT macro used in api test
DT macro should be used is DT_ENUM* for enum type bindings

Signed-off-by: Swift Tian <swift.tian@ambiq.com>
2024-10-22 22:46:47 -04:00
Jilay Pandya 271aeaf5f9 tests: drivers: stepper: stepper_api: test cb user_data
This commit does the following:
1. tests set_callback and user_data
2. fixes the api as well as the drivers by passing user_data
back to the set callback

Signed-off-by: Jilay Pandya <jilay.pandya@outlook.com>
2024-10-22 22:46:26 -04:00
Dimitrije Lilic 2507752d7f tests: drivers: spi: spi_loopback: Support RTIO tests for APARD32690
Add overlay for APARD32690 board and add a new test case to
test RTIO functionalities of SPI MAX32 driver.

Signed-off-by: Dimitrije Lilic <dimitrije.lilic@orioninc.com>
2024-10-22 20:42:20 +02:00
TOKITA Hiroshi e78811bcd6 tests: drivers: build_all: ethernet: Add devices build tests
Add build tests for following devices.

- microchip,ksz8081
- realtek,rtl8211f
- nxp,tja1103
- microchip,lan865x

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-22 20:42:05 +02:00
Luis Ubieda 9e45529438 tests: build_all: sensor: Add int-gpios to ICM42688
Required to use trigger modes.

Signed-off-by: Luis Ubieda <luisf@croxel.com>
2024-10-22 20:41:43 +02:00
Neil Chen 98110e2946 tests: drivers: can: timing: enable full timing test on frdm_mcxn236
Enable the full range of CAN timing tests on the NXP FRDM-MCXN236 board.

Signed-off-by: Neil Chen <cheng.chen_1@nxp.com>
2024-10-22 20:39:50 +02:00
Sadik Ozer d8753a119d tests: drivers: flash: Add MAX32690 boards overlay file
Enable flash driver test for MAX32690 boards.

Signed-off-by: Mert Vatansever <mert.vatansever@analog.com>
Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-22 20:39:41 +02:00
Tahsin Mutlugun ab49ba41d4 tests: drivers: flash: Add MAX32680EVKIT board overlay file
Enable flash driver tests for MAX32680EVKIT board.

Signed-off-by: Tahsin Mutlugun <Tahsin.Mutlugun@analog.com>
2024-10-22 20:39:41 +02:00
Sadik Ozer 5aae75548c tests: drivers: flash: Add MAX32675EVKIT board overlay file
Enable flash driver test for MAX32675EVKIT board.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-22 20:39:41 +02:00
Sadik Ozer ccd84905ad tests: drivers: flash: Add MAX32672 boards overlay file
Enable flash driver test for MAX32672 boards.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-22 20:39:41 +02:00
Sadik Ozer 931d89e6b8 tests: drivers: flash: Add MAX32670EVKIT board overlay file
Enable flash driver test for MAX32670EVKIT board.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-22 20:39:41 +02:00
Furkan Akkiz 198518df5b tests: drivers: flash: Add MAX32666 boards overlay file
Enable flash driver test for MAX32666 boards.

Signed-off-by: Furkan Akkiz <hasanfurkan.akkiz@analog.com>
2024-10-22 20:39:41 +02:00
Furkan Akkiz b2b8957d80 tests: drivers: flash: Add MAX32662EVKIT board overlay file
Enable flash driver test for MAX32662EVKIT board.

Signed-off-by: Furkan Akkiz <hasanfurkan.akkiz@analog.com>
2024-10-22 20:39:41 +02:00
Sadik Ozer 539a7a18d6 tests: drivers: flash: Add MAX32655 boards overlay file
Enable flash test for MAX32655 boards.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-22 20:39:41 +02:00
Wajdi ELMuhtadi fb45c6d93a drivers: sensor: wsen_hids_2525020210002: add sensor driver
Add wsen_hids_2525020210002 driver with
the corrected name and compatibility with
the hal update as well as added new features.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-22 14:03:08 +02:00
Chris Ruehl a3f863e3f1 Drivers: Sensors: Bosch bmp390 merge into bmp388
Add support for Bosch bmp390 sensor, the drop in replacement for the
bmp388 with same register but different chip-id. This patch make use
of "bosch_bmp390" or "bosch_bmp388" and set the specific chip-id in a
data->chip-id variable, which then used to check against the register
value.

Additional, manual shift operation had been replaced with ENDIAN safe
macros and calibration values with target variable of int16_t add a
cast for it.

bmp388_spi: read register implementation wrong, fixed it.
tx-buffer must be <addr><dummy><dummy> in order to receive the
register value. Read registers in burst mode and have rx and tx
buffer same spi_buf to avoid clock stop and delay with nrf5.

Signed-off-by: Chris Ruehl <chris@gtsys.com.hk>
2024-10-22 13:58:33 +02:00
Bjarki Arge Andreasen 3272db87a4 tests: drivers: comparator: add gpio_loopback test suite
Add test suite which uses GPIO loopback to produce a "very low" and
"very high" voltage at the positive input of the comparator using the
output of a GPIO. The negative input is set to a voltage between the
high and low output voltages of the GPIO using whichever internal
reference is available to the comparator.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-21 18:50:45 -05:00
Declan Snyder c01ccfe719 boards: frdm_mcxw71: Enable LPSPI
Enable LPSPI1 controller on frdm_mcxw71 and spi loopback test

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2024-10-21 18:39:49 -05:00
Juliane Schulze 7adcebc675 vcnl36825t: add trigger capability
Adds trigger capability to the Vishay VCNL36825T sensor.

Signed-off-by: Juliane Schulze <juliane.schulze@deveritec.com>
2024-10-21 12:41:12 +02:00
Tu Nguyen Van 55bcc4a576 tests: drivers: spi: enable test spi_loopback
enable test spi_loopback for dspi feature on s32z27x
devices

Signed-off-by: Tu Nguyen Van <tu.nguyenvan@nxp.com>
2024-10-21 12:39:04 +02:00
Carles Cufi cb47c62259 boards: nordic: Remove nRF54L15 PDK
The nRF54L15 Development Kit is now available, so remove the Preview
Development Kit (PDK).

Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
2024-10-21 01:46:39 +01:00
Carles Cufi c85e418eda boards: nordic: nrf54l15dk: Fix references to pdk
A bunch of copy-paste mistakes when adding the nRF54L15 DK added stale
references to the Preview DK (PDK).

Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
2024-10-21 01:46:39 +01:00
Gerard Marull-Paretas f989711a60 pm: s/power-domain/power-domains and add power-domain-names
Some devices may belong to >1 power domain, so with the current design
this is something not possible to describe. It's worth to note that
Linux also uses the `power-domains` naming scheme, not `power-domain`.
This patch also introduces `power-domain-names` so that each entry in
`power-domains` can be given a name if needed. `#power-domain-cells`
is now required as well.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-10-18 17:45:21 +01:00
Bjarki Arge Andreasen 0502189729 tests: drivers: comparator: shell: use platform_allow
Change integration_platform -> platform_allow to not build the
shell test suite for all supported boards.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-18 17:44:30 +01:00
Nikodem Kastelik e9f1f41e28 tests: drivers: retained_mem: api: add support for nrf54h20
retained_mem driver is now compatible with nrf54h20 cpuapp & cpurad.
Also add missing .conf for nrf54l15.

Signed-off-by: Nikodem Kastelik <nikodem.kastelik@nordicsemi.no>
2024-10-18 08:17:53 -04:00
Sadik Ozer e2f5439314 tests: drivers: w1: Move platform_allow in w1-serial
As per of str4t0m request, it is moved under
w1-serial section more detail in below link
https://github.com/zephyrproject-rtos/zephyr/pull/75009

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-18 14:16:14 +02:00
Furkan Akkiz 6380c961d1 tests: drivers: w1: Enable 1-wire driver tests for max32666evkit board
Enable 1-wire driver test for MAX32666EVKIT

Signed-off-by: Furkan Akkiz <hasanfurkan.akkiz@analog.com>
2024-10-18 14:16:14 +02:00
Sadik Ozer 0c7e3e1fe0 tests: drivers: w1: Add MAX32666FTHR board overlay file
Add MAX32666FTHR board overlay files to w1_api test be supported.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-18 14:16:14 +02:00
Sadik Ozer aed0bf33e5 tests: drivers: w1: Add APARD32690 board overlay file
Add APARD32690 board overlay files to w1_api test be supported.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-18 14:16:14 +02:00
Sadik Ozer 2a8df0a37c tests: drivers: w1: Add MAX32690EVKIT board overlay file
Add MAX32690EVKIT board overlay files to w1_api test be supported.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-18 14:16:14 +02:00
Tahsin Mutlugun e3355e9a53 tests: drivers: w1: Add MAX32680EVKIT board overlay file
Support MAX32680EVKIT in 1-wire tests.

Signed-off-by: Tahsin Mutlugun <Tahsin.Mutlugun@analog.com>
2024-10-18 14:16:14 +02:00
Sadik Ozer 0f3aa5d53d tests: drivers: w1: Add MAX32655EVKIT board overlay file
Add MAX32655EVKIT board overlay files to w1_api test be supported.

Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
2024-10-18 14:16:14 +02:00
Ha Duong Quang 08a4259a0a boards/tests: dma: enable dma for S32Z270
Enable dma boards/test for S32Z270.

The non-cacheable memory used for DMA tests (chan_blen_transfer and
loop_transfer) is split from the system SRAM.

Signed-off-by: Ha Duong Quang <ha.duongquang@nxp.com>
2024-10-18 14:16:05 +02:00
Tobias Pisani a2ac676a10 tests: drivers: display: build_all: add ssd1322
Add ssd1322 to display build test

Signed-off-by: Tobias Pisani <mail@topisani.dev>
2024-10-18 09:18:21 +02:00
Tomáš Juřena 953436b185 test: sensor: ina230: Add INA236
Update tests to validate INA236 chip

Signed-off-by: Tomáš Juřena <jurenatomas@gmail.com>
2024-10-17 15:39:18 -04:00
Piotr Kosycarz fb86c453cc tests: drivers: sensor: temp_sensor: verify room temperature
Verify sensor reading - should be within room temperature limits.

Signed-off-by: Piotr Kosycarz <piotr.kosycarz@nordicsemi.no>
2024-10-17 15:38:37 -04:00
Hake Huang 2850841106 test: gpio: gpio_basic_api: enhance the gpio test
1. add delay read config for platforms that has capacitor with pin
2. add dts pin flags to gpio_pin_config when output.

Signed-off-by: Hake Huang <hake.huang@nxp.com>
2024-10-17 10:47:22 -04:00
Hake Huang 43425014c6 tests: gpio: gpio_basic_api split input and ouput
input and output shall be split and configure by dts

fixes: #78381

Signed-off-by: Hake Huang <hake.huang@nxp.com>
2024-10-17 10:47:22 -04:00
Hake Huang 999e31e26f tests: gpio: gpio_basic_api: update customerized board list
update boards that can not use the common pins
mimxrt102x reuse with ethernet
mimxrt106x has external pull up
lpcxpresso55s3x reuse with int

add CONFIG_SKIP_PULL_TEST by default to be more general
user can enable this test in customized case with select pin

ST prefer to using D9 D10 pair to testing.

Signed-off-by: Hake Huang <hake.huang@nxp.com>
2024-10-17 10:47:22 -04:00
Daniel Kampert 9d0486e3ee drivers: sensor: Add support for Broadcom APDS-9306
- Add Broadcom / Avago APDS-9306 ambient light sensor driver

Signed-off-by: Daniel Kampert <DanielKampert@kampis-elektroecke.de>
2024-10-17 09:46:53 +02:00
Reto Schneider 7dbcf65562 tests: drivers: dma: Enable for board sgrm
This allows to run the test 'chan_blen_transfer' and 'loop_transfer' on
the sgrm board.

The functionality tested in `chan_link_transfer` and `scatter_gather` is
not (yet) supported by the Si32 DMA driver, and those tests therefore
not enabled.

Signed-off-by: Reto Schneider <reto.schneider@husqvarnagroup.com>
2024-10-17 09:45:54 +02:00
Andrej Butok e53eec0851 yaml: use EXTRA_CONF_FILE in .yaml files
Use EXTRA_CONF_FILE in sample yaml files,
that replaced deprecated OVERLAY_CONFIG
since the Zephyr v3.4 release.

Signed-off-by: Andrej Butok <andrey.butok@nxp.com>
2024-10-17 09:45:25 +02:00
Dominik Ermel 3e8ea52e21 tests/flash/common: Increase ztest stack size
The commit sets CONFIG_ZTEST_STACK_SIZE to 4096.

Fixes #79801

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-10-17 09:43:40 +02:00
Jamie McCrae b5b335ef6e tests: drivers: build_all: eeprom: Add nrf9131ek Kconfig fragment
Adds a Kconfig fragment which changes the MFD init priority

Signed-off-by: Maximilian Deubel <maximilian.deubel@nordicsemi.no>
Signed-off-by: Jamie McCrae <jamie.mccrae@nordicsemi.no>
2024-10-16 16:37:12 +01:00
Andrzej Głąbek edc4f75b61 soc: nordic: Fix the way of enabling clock control for nRF54H Series
This is a follow-up to commit 7a2ce2882a.

Do not enable clock control by default on nRF54H Series SoCs when
the system timer is present, because clock control is not needed
for this purpose there.

Add missing `default y` in the CLOCK_CONTROL_NRF2 Kconfig option that
enables compilation of clock control drivers for nRF54H Series.
This way modules that actually require clock control (like drivers
that use radio) will be able to enable it using the generic option
(CLOCK_CONTROL), not the above one that is specific for nRF54H.

Update accordingly applications that referenced the CLOCK_CONTROL_NRF2
option.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2024-10-16 16:36:51 +01:00
TOKITA Hiroshi 8c705cabab tests: drivers: build_all: Add a build_all test for wifi
The test targets the following devices at this time.

- atmel,winc1500
- inventek,eswifi
- inventek,eswifi-uart

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-16 12:27:05 +02:00
Sylvio Alves 5a205518a6 tests: drivers: counter: fix no_alarm use case
In the test scenario without alarms, it might
be the case that counter is already running and
it will not match the expected tick.
This adds a tick offset into the expected value
based on current counter reading.

Signed-off-by: Sylvio Alves <sylvio.alves@espressif.com>
2024-10-16 09:58:47 +02:00
Neil Chen 0fa766c8ea tests: drivers/regulator/voltage: Add regulator test for NXP frdm_mcxn236
Support regulator(vref) output vt oltage test for NXP frdm_mcxn236

Signed-off-by: Neil Chen <cheng.chen_1@nxp.com>
2024-10-16 09:57:49 +02:00
Neil Chen a6b414d46b tests: drivers/adc/adc_api: Support adc api test for NXP frdm_mcxn236
Support adc api test for NXP frdm_mcxn236

Signed-off-by: Neil Chen <cheng.chen_1@nxp.com>
2024-10-16 09:57:49 +02:00
Gerard Marull-Paretas eb45da5a44 tests: pwm_api: enable dma_fast_region in nRF54H20 DK overlay
The overlay makes use of the dma_fast_region without enabling it.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-10-16 09:55:08 +02:00
Hake Huang 193bfabd3f tests: uart_async_api: update test for dma usage
1. ensure the two dma buffers all aligned with 32 bits
2. clean the rx_data_idx at test begin

Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
2024-10-15 19:09:19 -04:00
Adam Kondraciuk dd7cfbc92e test: drivers: pwm: add fast PWM
Add fast PWM instance for nRF54H20 device.

Signed-off-by: Adam Kondraciuk <adam.kondraciuk@nordicsemi.no>
2024-10-15 19:08:03 +01:00
Stoyan Bogdanov 6ec8a53c9b tests: drivers: build_all: gpio: Correct max14906 and max14916 compat
Replace wrong compatibility strings for max14906 and max14916.
Fix wrong addressees for max14906 and max14916.

Signed-off-by: Stoyan Bogdanov <sbogdanov@baylibre.com>
2024-10-15 19:04:10 +01:00
Jilay Pandya abf5520a19 test: drivers: stepper: adjust tests as per the new api
This commit adjusts the tests as per the updated stepper api.

Signed-off-by: Jilay Pandya <jilay.pandya@zeiss.com>
2024-10-15 13:53:16 +02:00
Grzegorz Swiderski 85b03949e4 boards: nordic: Flatten shared_ramxx_region nodes
Update the default memory maps for `nrf54h20dk` and `nrf9280pdk` to
remove the `shared_ram20_region` and `shared_ram3x_region` nodes,
because their child nodes no longer need to be grouped together:

  * IPC buffers in RAM20 are statically allocated.
  * DMA buffers in RAM3x have separate access owners.

Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
2024-10-15 04:11:21 -04:00
Grzegorz Swiderski 13b1cfa5ec boards: nordic: Align with updated Nordic owned memory bindings
Apply the following changes to `nrf54h20dk` and `nrf9280pdk`:

* Convert `perm-*` properties to the newly introduced `nordic,access`,
  both in board files and tests.

* Redefine shared regions to specify multiple access owners per node,
  and ensure that each such region is reserved by one domain at a time.
  `cpuapp_cpurad_ram0x_region` is only enabled by Radiocore, while
  `cpuapp_cpucell_ram0x_region` is only enabled by Application core.

* Divide `shared_ram3x_region` so that each sub-region is owned by a
  different domain. Their addresses must be rounded down to fit the
  current UICR format.

Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
2024-10-15 04:11:21 -04:00
Paweł Czaplewski 217fdf9d24 tests: drivers: i2c: fix I2C registers configuration in i2c.dtsi
Fixed incorrect I2C register definitions in the test file
tests/drivers/build_all/sensor/i2c.dtsi.

Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
2024-10-15 04:10:40 -04:00
Paweł Czaplewski 9fe959857a drivers: sensor: tmp1075: Add tmp1075 sensor driver and sample
TI tmp1075 driver implemented based on tmp108 driver.
The driver initializes the sensor based on the DTS.

Added tmp1075 example overlay file to thermometer sample.
All you need to do to use the sensor is to connect the I2C and
optionally interrupt line.
To see default DTS configuration option inspect `ti,tmp1075.yaml`
bindings file and sensor spec.

Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
2024-10-15 04:10:40 -04:00
TOKITA Hiroshi 0ce32c963e tests: drivers: build_all: lora: Add devices build tests
Add build tests for the following devices.

- semtech,sx1262
- semtech,sx1272
- reyax,rylrxxx

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-15 04:09:56 -04:00
Lucien Zhao 4db46a3331 tests: drivers: counter_basic_api: add qtmr1_timer0 configuration
add qtmr1_timer0 configuration for counter_basic_api case

Signed-off-by: Lucien Zhao <lucien.zhao@nxp.com>
2024-10-15 04:37:47 +01:00
Jordan Yates 4361c96c48 adc: current_sense_amplifier: resistance in milli-ohms
Change the unit of the sense resistor in the devicetree binding from
micro-ohms to milli-ohms. This is done for three reasons.

Firstly, the maximum value resistor that can currently be represented
is 4.2 kOhms, due to the limitation of devicetree properties to 32 bits.

Secondly, storing the resistance at such a high resolution makes
overflows much more likely when the desired output unit is micro-amps,
not milli-amps.

Finally, micro-ohms, are an unnecessarily precise unit for the purpose
of these calculations, and a resolution that is not realistic to
achieve. The high resistor resolution results in large divisors that
reduce the resolution of outputs. Unlike resistors characterised down to
the micro-ohm, devices wanting to measure micro-amps are actually
realistic.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2024-10-14 13:05:07 +02:00
TOKITA Hiroshi eebed141cf tests: drivers: build_all: Add a build_all test for flash
The test targets the following devices at this time.

- atmel,at45
- jedec,spi-nor

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-11 13:16:53 -04:00
TOKITA Hiroshi 60dc055f9e tests: drivers: build_all: Add a build_all test for bbram
The test targets the following devices at this time.

- microchip,mcp7940n

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-11 13:16:53 -04:00
TOKITA Hiroshi 23496f5208 tests: drivers: build_all: eeprom: Add config for ti,tmp116-eeprom
Add configuration to add `ti,tmp116-eeprom` to build test.

Also, adding emulator build test.

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-11 13:16:53 -04:00
Fabio Baltieri 523efee132 tests: build_all: input: clean up the i2c device list
Make the address sequential again, drop a stray blank line.

Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
2024-10-11 13:15:27 -04:00
Wajdi ELMuhtadi 9af50a7b19 drivers: sensor: wsen_tids: remove wsen_tids driver
Remove wsen_tids since the hal update
is no longer compatible with this version.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-11 13:15:10 -04:00
Wajdi ELMuhtadi 8f684cfe9b drivers: sensor: wsen_pdus: remove wsen_pdus driver
Remove wsen_pdus since the hal update
is no longer compatible with this version.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-11 13:15:10 -04:00
Wajdi ELMuhtadi 8c0b09ddc3 drivers: sensor: wsen_pads: remove wsen_pads driver
Remove wsen_pads since the hal update
is no longer compatible with this version.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-11 13:15:10 -04:00
Wajdi ELMuhtadi 449bf8019c drivers: sensor: wsen_hids: remove wsen_hids driver
Remove wsen_hids since the hal update
is no longer compatible with this version.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-11 13:15:10 -04:00
Wajdi ELMuhtadi 5f584052d8 drivers: sensor: wsen_itds: remove wsen_itds driver
Remove wsen_itds driver since the hal update
is no longer compatible with this version.

Signed-off-by: Wajdi ELMuhtadi <wajdi.elmuhtadi@we-online.com>
2024-10-11 13:15:10 -04:00
Quy Tran 4793e00ae8 boards: renesas: Add configurations to support pwm on EK-RA8D1
Add support for PWM driver on EK-RA8D1

Signed-off-by: Quy Tran <quy.tran.pz@renesas.com>
2024-10-11 09:28:29 +02:00
Quy Tran 1391355ac4 boards: renesas: Add configurations to support pwm on MCK-RA8T1
Add support for PWM driver on MCK-RA8T1

Signed-off-by: Quy Tran <quy.tran.pz@renesas.com>
2024-10-11 09:28:29 +02:00
Duy Phuong Hoang. Nguyen 59dbbb347d drivers: pwm: Initial support for PWM driver on RA8
Add PWM driver code support for RA8. This support is using
GPT HW

Signed-off-by: Duy Phuong Hoang. Nguyen <duy.nguyen.xa@renesas.com>
2024-10-11 09:28:29 +02:00
Bjarki Arge Andreasen 4ff9886e48 tests: drivers: comparator: add shell test suite
Add test suite for comparator device driver shell.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-10 20:24:52 -04:00
Bjarki Arge Andreasen 6ed855a53f tests: drivers: build_all: comparator: add mcux_acmp
Add mcux_acmp device driver to build_all test suite.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-10 20:24:52 -04:00
Bjarki Arge Andreasen a4fce338ac tests: drivers: build_all: comparator: add nrf_lpcomp
Add nrf_lpcomp to build_all comparator test suite.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-10 20:24:52 -04:00
Bjarki Arge Andreasen 13af5ca0dc tests: drivers: build_all: add comparator test suite
Add comparator build_all test suite designed to test multiple
devicetree overlays and boards for each comparator device driver.

Signed-off-by: Bjarki Arge Andreasen <bjarki.andreasen@nordicsemi.no>
2024-10-10 20:24:52 -04:00
Michal Smola d04c3c1817 tests: drivers: counter_basic_api: Support mcux rtc counter
Allow counter_mcux_rtc in reliable_cancel_capable test.

Signed-off-by: Michal Smola <michal.smola@nxp.com>
2024-10-10 14:59:35 -04:00
Pieter De Gendt 23871f6ecb tests: drivers: build_all: display: Add coverage
Make display tests depend on the "display" feature. And add a testcase
as example.

Signed-off-by: Pieter De Gendt <pieter.degendt@basalte.be>
2024-10-10 14:58:13 -04:00