The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
found some references to files (via :zephyr_file: and :zephyr-app:) that
were moved, so the links were broken
Fixes: #19660
Signed-off-by: David B. Kinder <david.b.kinder@intel.com>
move misc/printk.h to sys/printk.h and
create a shim for backward-compatibility.
No functional changes to the headers.
A warning in the shim can be controlled with CONFIG_COMPAT_INCLUDES.
Related to #16539
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
move misc/__assert.h to sys/__assert.h and
create a shim for backward-compatibility.
No functional changes to the headers.
A warning in the shim can be controlled with CONFIG_COMPAT_INCLUDES.
Related to #16539
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
move sensor.h to drivers/sensor.h and
create a shim for backward-compatibility.
No functional changes to the headers.
A warning in the shim can be controlled with CONFIG_COMPAT_INCLUDES.
Related to #16539
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
move gpio.h to drivers/gpio.h and
create a shim for backward-compatibility.
No functional changes to the headers.
A warning in the shim can be controlled with CONFIG_COMPAT_INCLUDES.
Related to #16539
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Change code from using now deprecated DT_<COMPAT>_<INSTANCE>_<PROP>
defines to using DT_INST_<INSTANCE>_<COMPAT>_<PROP>.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Anas Nashif