Commit Graph

3 Commits

Author SHA1 Message Date
Andrew Boie 9df9994572 x86: fix XIP SOC support and defaults
XIP support in x86 was something of a mess. This
patch does the following:

- Generic ia32 SOC no longer defines a "flash" region
  as generic X86 devices don't have a microcontroller-
  like concept of flash. The same has been done for apollo_lake.
- Generic ia32 and apollo_lake SOCs starts memory at 1MB.
- Generic ia32 SOC may optionally have CONFIG_XIP enabled.
  The board definition must provide a flash region definition
  that gets exposed as DT_PHYS_LOAD_ADDR.
- Fixed definitions for RAM/ROM source addresses in ia32's
  linker.ld when XIP is turned off.
- Support for enabling XIP on apollo_lake SOC removed, there's
  no use-case.
- acrn and gpmrb boards have flash and XIP related definitions
  removed.
- qemu_x86 has a fake flash region added, immediately after system
  RAM, for use when XIP is enabled. This used to be in the ia32 SOC.
  However, the default for qemu_x86 is to now have XIP disabled.
- Fixed tests/kernel/xip to run by default on boards that enable
  XIP by default, plus an additional test to exercise XIP on
  qemu_x86 (which supports it but has XIP switched off by default)

The overall effect of this patch is to:

- Remove XIP configuration for SOC/boards where it does not make
  any sense to have it
- Support testing XIP on qemu_x86 via tests/kernel/xip, but leave
  it off by default for other tests, to ensure it doesn't bit-rot
  and that the system works in both scenarios.
- XIP remains an available feature for boards that need it.

Fixes: #18956

Signed-off-by: Andrew Boie <andrew.p.boie@intel.com>
2019-09-11 21:11:38 -04:00
Niranjhana N 50f112cdc1 tests: xip: convert to ztest
- replaced a test point with ztest API
- separated the main file into two:
    - main.c, which has ztest entry
    - xip.c, which has the original routine

JIRA: ZEP-2382

Signed-off-by: Niranjhana N <niranjhana.n@intel.com>
2017-08-07 22:31:27 -04:00
Anas Nashif 1d3b16a74a tests: remove redundant test_ from test names
Change-Id: Ieeb2c44b2891b3cf451d9445b8959b1f338d731e
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-12-24 13:46:50 +00:00