Commit Graph

8 Commits

Author SHA1 Message Date
Anas Nashif b4598c19e3 tests: disable building of FXOS8700 sensor for all boards
This sensor was made dependent on certain boards, so building it with
all boards fails now. Disable until proper fix exists.

Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-07-28 09:40:38 -05:00
Anas Nashif 25aa9e8e36 tests: enable syslog for sensors
Change-Id: If866083d5707a83b1df0a3411f3a848fdf40dbcb
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-03-25 12:00:30 +00:00
Anas Nashif f6e039062a kernel: remove dependency on CONFIG_NANO_TIMERS/TIMEOUTS
Remove legacy option and use SYS_CLOCK_EXISTS where appropriate.

Change-Id: I3d524ea2776e638683f0196c0cc342359d5d810f
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2017-01-08 18:09:52 +00:00
Benjamin Walsh a1622472c3 drivers: hp206 driver does not need 2000 ticks/s frequency
From code inspection, the driver always took timeouts in milliseconds.
The only sub-ms wait uses k_busy_wait(), which has microseconds
granularity, but its granularity does not depend on the system clock
tick rate.

Change-Id: If48363fd1fbeeb8e5ff0f0f2ca86e671d63bc571
Signed-off-by: Benjamin Walsh <benjamin.walsh@windriver.com>
2016-12-21 19:50:06 +00:00
Marcus Shawcroft db20018bad tests: Add FXOS8700 sensor to driver build_all test.
Change-Id: I60f62d54b3743335ae80bbb58b2c4ce690b43f41
Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-28 10:54:45 +00:00
Marcus Shawcroft e7a943385d test: drivers/build_all support HP206C
Change-Id: Ifad32d59a9786e5b1334532c5c6e7f29657c2a77
Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-26 20:51:10 +00:00
Marcus Shawcroft 81da76e39b tests: Add sensor HTS221 to driver/build-all test case.
Change-Id: Ifd5acf8bfaa75a44458b448001c0f2335fd6364d
Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:10:15 +00:00
Marcus Shawcroft 9a60286f41 tests: Adjust drivers/build_all to build for more boards.
The build_all tests contain an ever growing list of device drivers to
build.  Ideally we minimize the number of images we build, but we
already observe that some of the tests, notably sensors, is too big
for some of our supported boards.

Rather disable an ever growing list of boards as the build_all tests
get bigger it would be better to split the tests into smaller chunks
that can reasonably be expected to run on any supported board.

We split the sensor test set into two, the division is arbitrary,
based on the name of the driver.  This allows us to remove the filter
on the quark_d2000.

The current split into two groups is arbirary, in the future it is
inevitable that as the list of supported drivers grows, we will need
to further subdivied the larger tests.

Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad
Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:10:14 +00:00