After running command --list-test-duplicates
I found out that some test cases have same names (duplicated).
To get rid of it, I decided to change names in .yaml files
Signed-off-by: Maksim Masalski <maksim.masalski@intel.com>
The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Update a number of boards that have arduino_gpio and arduino_i2c
support in their dts files to show that they support that in the
board.yaml file. This allows coverage on several shield tests that
utilize the tags 'arduino_gpio' and 'arduino_i2c'.
Exlucde stm32mp157c_dk2 from some of the samples right now since the
connector on the board doesn't support A2/A3. Also remove the duplicate
of exluding disco_l475_iot1.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Change arduino_header depend to arduino_gpio as that is more meaningful.
Its easy to mistake arduino_header to mean the board has an arduino
header in general. What we want to depend on is that we have the gpio
connector in the dts that has 'arduino_header' as the node label.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Provide two basic example samples to test the x-nucleo-iks01a3 shield:
- Standard (Mode 1)
- SensorHub (Mode 2)
Signed-off-by: Armando Visconti <armando.visconti@st.com>
Maksim Masalski