Other IOs use this format, so lets be consistent and use
I2C_0 instead of I2C0 and I2C_1 an instead of I2C1.
Change-Id: I591ab08e14bd533ef0fac38e596559da783863b8
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
This adds the necessary tags to enable building the grove_lcd and
i2c_fujitsu_fram sample apps, so that the Atmel SAM3 I2C driver
will be built to test for build breakage.
Change-Id: I4adfb6336e82a6d407bbd5e9888c27d5f6bc5be1
Signed-off-by: Daniel Leung <daniel.leung@intel.com>
This patch replaces all occurences of the macro DEV_FAIL by -EIO
at the driver level. So this patch touch the files under drivers/,
include/ and samples/drivers/ when applicable.
This patch is part of the effort to transition from DEV_* codes to
errno.h codes.
Change-Id: I0594ab5dbe667e074c250129e7c13ce512ac940f
Signed-off-by: Andre Guedes <andre.guedes@intel.com>
This patch replaces all occurences of the macro DEV_OK by the actual
value 0 at the driver level. So this patch touch the files under
drivers/, include/ and samples/drivers/.
This patch is part of the effort to transition from DEV_* codes to
errno.h codes.
Change-Id: I69980ecb9755f2fb026de5668ae9c21a4ae62d1e
Signed-off-by: Andre Guedes <andre.guedes@intel.com>
All SoC specific driver tests go to samples/drivers.
Change-Id: Ia9aa2140465320a548504ddb7a44569e2d2af6bd
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Anas Nashif