The seasonal overhaul of test identifiers aligning the terms being used
and creating a structure. This is hopefully the last time we do this,
plan is to document the identifiers and enforce syntax.
The end-goal is to be able to generate a testsuite description from the
existing tests and sync it frequently with the testsuite in Testrail.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Add internal API to enter and exit deep power-down mode. Add Kconfig
option to return to DPD whenever device is not active.
When device power management becomes more mature it should be possible
to implement it, which would allow use of DPD without having to enter
and exit DPD between consecutive transactions.
Signed-off-by: Peter A. Bigot <pab@pabigot.com>
convert sample and test yaml filters that utilize a DT_ define to
instead use a dt_ function. The intent is to remove the Kconfig
generated DT defines and just make directy queries into the device tree.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
There are multiple flash implementations. This sample was originally
written for the W25QXXDV driver, but has since been used for
jedec,spi-nor. The sample should work with multiple drivers.
Add device name sources for several drivers, falling back to spi-nor
which was recently used as a test filter.
Signed-off-by: Peter A. Bigot <pab@pabigot.com>
Add harness console and include regex for output
pattern matching to determine correctness of
sample execution.
Signed-off-by: Spoorthi K <spoorthi.k@intel.com>
This will prepare test cases and samples with metadata and information
that will be consumed by the sanitycheck script which will be changed to
parse YAML files instead of ini.
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
Anas Nashif