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zephyr/tests/drivers/build_all/sensors_a_m.conf

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tests: Adjust drivers/build_all to build for more boards. The build_all tests contain an ever growing list of device drivers to build. Ideally we minimize the number of images we build, but we already observe that some of the tests, notably sensors, is too big for some of our supported boards. Rather disable an ever growing list of boards as the build_all tests get bigger it would be better to split the tests into smaller chunks that can reasonably be expected to run on any supported board. We split the sensor test set into two, the division is arbitrary, based on the name of the driver. This allows us to remove the filter on the quark_d2000. The current split into two groups is arbirary, in the future it is inevitable that as the list of supported drivers grows, we will need to further subdivied the larger tests. Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:36:29 +08:00
CONFIG_GPIO=y
CONFIG_I2C=y
tests: expand sensor build testing by enabling more sensors This will help catch build issues with sensors by enabling all sensors we have into one single application using all supported IOs. Change-Id: Id8c201b8ae9b74dccc62d6440899ff487ea09d43 Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 19:44:09 +08:00
CONFIG_NANO_TIMEOUTS=y
tests: Adjust drivers/build_all to build for more boards. The build_all tests contain an ever growing list of device drivers to build. Ideally we minimize the number of images we build, but we already observe that some of the tests, notably sensors, is too big for some of our supported boards. Rather disable an ever growing list of boards as the build_all tests get bigger it would be better to split the tests into smaller chunks that can reasonably be expected to run on any supported board. We split the sensor test set into two, the division is arbitrary, based on the name of the driver. This allows us to remove the filter on the quark_d2000. The current split into two groups is arbirary, in the future it is inevitable that as the list of supported drivers grows, we will need to further subdivied the larger tests. Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:36:29 +08:00
CONFIG_SENSOR=y
CONFIG_SPI=y
tests: sensors: expand coverage with logging enabled Change-Id: Icf99288444afb2154b32902e805abf3f9bdf36bf Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 22:30:17 +08:00
CONFIG_SYS_LOG_SENSOR_LEVEL=4
tests: Adjust drivers/build_all to build for more boards. The build_all tests contain an ever growing list of device drivers to build. Ideally we minimize the number of images we build, but we already observe that some of the tests, notably sensors, is too big for some of our supported boards. Rather disable an ever growing list of boards as the build_all tests get bigger it would be better to split the tests into smaller chunks that can reasonably be expected to run on any supported board. We split the sensor test set into two, the division is arbitrary, based on the name of the driver. This allows us to remove the filter on the quark_d2000. The current split into two groups is arbirary, in the future it is inevitable that as the list of supported drivers grows, we will need to further subdivied the larger tests. Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:36:29 +08:00
test: drivers/build_all support HP206C Change-Id: Ifad32d59a9786e5b1334532c5c6e7f29657c2a77 Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-26 20:10:04 +08:00
# Some sensor drivers (notably HP206C) demand high tick rates:
CONFIG_SYS_CLOCK_TICKS_PER_SEC=2000
tests: expand sensor build testing by enabling more sensors This will help catch build issues with sensors by enabling all sensors we have into one single application using all supported IOs. Change-Id: Id8c201b8ae9b74dccc62d6440899ff487ea09d43 Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 19:44:09 +08:00
CONFIG_ADC=y
CONFIG_AK8975=y
CONFIG_BMA280=y
CONFIG_BME280=y
CONFIG_DHT=y
tests: Add FXOS8700 sensor to driver build_all test. Change-Id: I60f62d54b3743335ae80bbb58b2c4ce690b43f41 Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-28 13:58:18 +08:00
CONFIG_FXOS8700=y
tests: expand sensor build testing by enabling more sensors This will help catch build issues with sensors by enabling all sensors we have into one single application using all supported IOs. Change-Id: Id8c201b8ae9b74dccc62d6440899ff487ea09d43 Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 19:44:09 +08:00
CONFIG_HDC1008=y
CONFIG_HMC5883L=y
tests: Add sensor HTS221 to driver/build-all test case. Change-Id: Ifd5acf8bfaa75a44458b448001c0f2335fd6364d Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 18:49:00 +08:00
CONFIG_HTS221=y
test: drivers/build_all support HP206C Change-Id: Ifad32d59a9786e5b1334532c5c6e7f29657c2a77 Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-26 20:10:04 +08:00
CONFIG_HP206C=y
tests: expand sensor build testing by enabling more sensors This will help catch build issues with sensors by enabling all sensors we have into one single application using all supported IOs. Change-Id: Id8c201b8ae9b74dccc62d6440899ff487ea09d43 Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 19:44:09 +08:00
CONFIG_ISL29035=y
CONFIG_LIS3DH=y
CONFIG_LIS3MDL=y
CONFIG_LPS25HB=y
CONFIG_LSM2DS0=y
CONFIG_LSM2DS0_GYRO=y
tests: Adjust drivers/build_all to build for more boards. The build_all tests contain an ever growing list of device drivers to build. Ideally we minimize the number of images we build, but we already observe that some of the tests, notably sensors, is too big for some of our supported boards. Rather disable an ever growing list of boards as the build_all tests get bigger it would be better to split the tests into smaller chunks that can reasonably be expected to run on any supported board. We split the sensor test set into two, the division is arbitrary, based on the name of the driver. This allows us to remove the filter on the quark_d2000. The current split into two groups is arbirary, in the future it is inevitable that as the list of supported drivers grows, we will need to further subdivied the larger tests. Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
2016-10-24 20:36:29 +08:00
CONFIG_LSM9DS0_MFD=y
tests: expand sensor build testing by enabling more sensors This will help catch build issues with sensors by enabling all sensors we have into one single application using all supported IOs. Change-Id: Id8c201b8ae9b74dccc62d6440899ff487ea09d43 Signed-off-by: Anas Nashif <anas.nashif@intel.com>
2016-10-07 19:44:09 +08:00
CONFIG_MAX44009=y
CONFIG_MCP9808=y
CONFIG_MPU6050=y