This change replaces the slot 0/1 terminology with primary/secondary
slot and replaces FLASH_AREA_IMAGE_0/1 with
FLASH_AREA_IMAGE_PRIMARY/SECONDARY. This naming convention may be more
understandable, fits better to MCUs with multiple images and it is an
architecture agnostic alternative as well.
Change-Id: I655a585f6ae023852c671ee6635399efe25209c9
Signed-off-by: David Vincze <david.vincze@arm.com>
Signed-off-by: David Brown <david.brown@linaro.org>
Apply the changes suggested by
cargo fix --edition-idioms
as well as a bit of cleanup of the results. The result should be more
idiomatic Rust 2018 and a good starting point moving forward.
Signed-off-by: David Brown <david.brown@linaro.org>
This test marks the status write regions as a bad region,
causing errors, but it is allowed to complete the swap. On
restart the firmware in slot0 should be validated and work.
Signed-off-by: Fabio Utzig <utzig@apache.org>
Now that the test infrastructure has changed so that the tests can be
run independently, create a series of cargo tests that run them. This
allows the tests to simply be run as:
cargo test
or possibly with feature flags
cargo test --features overwrite-only
It is also possible to run individual tests by giving their name after
the "cargo test" command.
Signed-off-by: David Brown <david.brown@linaro.org>
As a start of doing the testing using Rust/Cargo's test framework, write
a test runner that just runs the existing tests. They run as they do
now, except that there is an assertion that there were no failures.
Signed-off-by: David Brown <david.brown@linaro.org>
David Vincze