In change
commit bb5635e074
Author: Fabio Utzig <utzig@utzig.org>
Date: Mon Apr 10 09:07:02 2017 -0300
Add test of multiple random resets while upgrading
in addition to adding the try_random_fails, it shuffled the order that
the initial interruption test ran. However, this test always clones
the flash device, so it doesn't matter what order the tests are run.
Revert this part of the change to avoid unnecessary complexity in the
code.
There are some instances of hard-coded offsets, which break if the
simulated device doesn't have the same configuration. Query these
from the flash descriptor rather than hard-coding them.
Although this contains a phantom pointer, because it is passed to C,
this generates a warning on every compile. Until this is fixed,
remove the lifetime declarations from the structures. The user will
have to make sure that the pointed-to structures remain until the C
structure is completed. For the common case of generating the C
structures just to make a call, this should be safe.
To make the images easier to identify during analysis, set the version
number. The major number tries to be set to the slot number, and the
build number is the byte offset.
Use the Rust logging so that normal messaging isn't overwhelmed by
messages printed. The default level is 'error' which will only print
full errors (including the failures at the end).
To run with warnings:
RUST_LOG=warn ./target/release/bootsim ...
This will print warnings, showing the particular failures in mind.
Using 'info' instead of 'warn' will print lots of progress as it runs.
'sim' is a small simulator for the bootloader's update code. It tests
untimely powerdowns to ensure that the bootloader will recover from a
power loss or reset at any time during the boot.
Note that, as of this commit, there are some failures in the test that
need to be investigated.
Also note that this build script does not output proper dependencies for
source files outside of the simulator directory, and won't rebuild the C
files if they or headers are modified.