microbit: refactoring and increase test coverage for IOPinDriver
Signed-off-by: deadprogram <ron@hybridgroup.com>
This commit is contained in:
parent
c457be7bb6
commit
89daf5c324
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@ -3,6 +3,7 @@ package microbit
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import (
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"bytes"
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"encoding/binary"
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"errors"
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"strconv"
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"gobot.io/x/gobot"
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@ -154,7 +155,7 @@ func (b *IOPinDriver) Finalize() (err error) {
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// DigitalRead reads from a pin
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func (b *IOPinDriver) DigitalRead(pin string) (val int, err error) {
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p, err := strconv.Atoi(pin)
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p, err := validatedPin(pin)
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if err != nil {
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return
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}
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@ -168,7 +169,7 @@ func (b *IOPinDriver) DigitalRead(pin string) (val int, err error) {
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// DigitalWrite writes to a pin
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func (b *IOPinDriver) DigitalWrite(pin string, level byte) (err error) {
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p, err := strconv.Atoi(pin)
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p, err := validatedPin(pin)
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if err != nil {
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return
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}
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@ -181,7 +182,7 @@ func (b *IOPinDriver) DigitalWrite(pin string, level byte) (err error) {
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// AnalogRead reads from a pin
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func (b *IOPinDriver) AnalogRead(pin string) (val int, err error) {
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p, err := strconv.Atoi(pin)
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p, err := validatedPin(pin)
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if err != nil {
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return
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}
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@ -217,6 +218,19 @@ func (b *IOPinDriver) ensureOutput(pin int) {
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}
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}
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func validatedPin(pin string) (int, error) {
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i, err := strconv.Atoi(pin)
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if err != nil {
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return 0, err
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}
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if i < 0 || i > 2 {
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return 0, errors.New("Invalid pin.")
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}
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return i, nil
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}
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// via http://stackoverflow.com/questions/23192262/how-would-you-set-and-clear-a-single-bit-in-go
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// Sets the bit at pos in the integer n.
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@ -1,6 +1,7 @@
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package microbit
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import (
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"errors"
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"strings"
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"testing"
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@ -53,6 +54,17 @@ func TestIOPinDriverDigitalRead(t *testing.T) {
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gobottest.Assert(t, val, 0)
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}
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func TestIOPinDriverDigitalReadInvalidPin(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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_, err := d.DigitalRead("A3")
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gobottest.Refute(t, err, nil)
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_, err = d.DigitalRead("6")
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gobottest.Assert(t, err, errors.New("Invalid pin."))
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}
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func TestIOPinDriverDigitalWrite(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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@ -61,6 +73,14 @@ func TestIOPinDriverDigitalWrite(t *testing.T) {
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gobottest.Assert(t, d.DigitalWrite("0", 1), nil)
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}
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func TestIOPinDriverDigitalWriteInvalidPin(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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gobottest.Refute(t, d.DigitalWrite("A3", 1), nil)
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gobottest.Assert(t, d.DigitalWrite("6", 1), errors.New("Invalid pin."))
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}
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func TestIOPinDriverAnalogRead(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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@ -75,6 +95,17 @@ func TestIOPinDriverAnalogRead(t *testing.T) {
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gobottest.Assert(t, val, 128)
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}
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func TestIOPinDriverAnalogReadInvalidPin(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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_, err := d.AnalogRead("A3")
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gobottest.Refute(t, err, nil)
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_, err = d.AnalogRead("6")
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gobottest.Assert(t, err, errors.New("Invalid pin."))
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}
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func TestIOPinDriverDigitalAnalogRead(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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@ -101,3 +132,16 @@ func TestIOPinDriverDigitalWriteAnalogRead(t *testing.T) {
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val, _ := d.AnalogRead("1")
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gobottest.Assert(t, val, 128)
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}
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func TestIOPinDriverAnalogReadDigitalWrite(t *testing.T) {
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a := NewBleTestAdaptor()
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d := NewIOPinDriver(a)
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a.TestReadCharacteristic(func(cUUID string) ([]byte, error) {
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return []byte{0, 0, 1, 128, 2, 1}, nil
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})
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val, _ := d.AnalogRead("1")
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gobottest.Assert(t, val, 128)
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gobottest.Assert(t, d.DigitalWrite("1", 0), nil)
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}
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