43 lines
1.5 KiB
ReStructuredText
43 lines
1.5 KiB
ReStructuredText
================================================
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``sd_stress`` SD card or mount point stress test
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================================================
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Performs stress testing on SD card or other mount points using the file system layer.
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A single test run.
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- Creates a staging directory
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- Creates multiple files in this directory. Writing, reading and verifying a set of bytes from each one.
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- Renames the staging directory.
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- Remove the created files from the renamed directory.
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- Remove the renamed directory.
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The following runtime options are available::
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nsh> sdstress -h
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Stress test on a mount point
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sdstress: [-r] [-b] [-f]
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-r Number of runs (1-10000), default 32
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-b Number of bytes (1-10000), default 4096
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-f Number of files (1-999), default 64
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An example of a completed test::
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nsh> sdstress -b 4096 -f 32 -r 5
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Start stress test with 32 files, 4096 bytes and 5 iterations.
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iteration 0 took 4063.445 ms: OK
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iteration 1 took 4158.073 ms: OK
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iteration 2 took 4216.130 ms: OK
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iteration 3 took 4295.138 ms: OK
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iteration 4 took 4352.903 ms: OK
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Test OK: Average time: 4217.138 ms
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The following Kconfig options can be used to configure the application at compile time.
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- ``CONFIG_TESTING_SD_STRESS`` - Enable the stress test utility.
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- ``CONFIG_TESTING_SD_STRESS_PROGNAME`` - The name of the program registered with nsh.
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- ``CONFIG_TESTING_SD_STRESS_PRIORITY`` - The priority of the task.
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- ``CONFIG_TESTING_SD_STRESS_STACKSIZE`` - The stacksize of the task.
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- ``CONFIG_TESTING_SD_STRESS_STACKSIZE`` - The mountpoint of the filesystem to test.
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