mirror of https://github.com/thesofproject/sof.git
167d0a0667
The main change in this patch is to allow process_test to use frequency dependent masks for frequency response and THD+N. It allows tests with pass/fail criteria for components like EQs and DCblock. SRC test not really changed but the small changes in passing test controls are updated there as well. In EQs tests the process test can decode the theoretical response from setup blob. The measured frequency response is compared to that. The test print and plot output look is improved for nicer reports. The runtime plots opening is disabled for batch mode operation but the plots now appear to test output directory in png format. Signed-off-by: Seppo Ingalsuo <seppo.ingalsuo@linux.intel.com> |
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.. | ||
aap_test_input.m | ||
aap_test_measure.m | ||
aip_test_input.m | ||
aip_test_measure.m | ||
dr_test_input.m | ||
dr_test_measure.m | ||
fr_test_input.m | ||
fr_test_measure.m | ||
g_test_input.m | ||
g_test_measure.m | ||
level_dbfs.m | ||
stdhpf.m | ||
stdhpf_get.m | ||
stdlpf.m | ||
stdlpf_get.m | ||
stdnotch.m | ||
stdnotch_get.m | ||
stdweight.m | ||
thdnf_test_input.m | ||
thdnf_test_measure.m |