mirror of https://github.com/thesofproject/sof.git
31e67a227c
The tests created lot of unnecessary fails when testing with S16_LE format. The test pass criteria for THD+N, DR is relaxed for tests with 16 bit data. Since the gain of SRC conversions was lowered to -1 dB the test case for gain need to be updated. The gain is retrieved from src_param() function. An exception is added for FS1 == FS2 case when data is passed through. In that case expected gain is 0 dB. The frequency response measurement grid does not necessarily cover the exact upper frequency of pass-band. Therefore the min. upper passband frequency is scaled by 0.99. This avoids measurement technique related fails in test. The chirp spectra test case was updated to use for RMS level criteria for testing the level of signal. The peak level was less robust and caused unnecessary test fails. The option to not open plot windows during test is set. It improves speed of test and avoids display clutter. Signed-off-by: Seppo Ingalsuo <seppo.ingalsuo@linux.intel.com> |
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| audio | ||
| qa | ||
| topology | ||
| CMakeLists.txt | ||