The tests created lot of unnecessary fails when testing with S16_LE
format. The test pass criteria for THD+N, DR is relaxed for tests
with 16 bit data.
Since the gain of SRC conversions was lowered to -1 dB the test
case for gain need to be updated. The gain is retrieved from
src_param() function. An exception is added for FS1 == FS2 case
when data is passed through. In that case expected gain is 0 dB.
The frequency response measurement grid does not necessarily cover
the exact upper frequency of pass-band. Therefore the min. upper
passband frequency is scaled by 0.99. This avoids measurement
technique related fails in test.
The chirp spectra test case was updated to use for RMS level criteria
for testing the level of signal. The peak level was less robust and
caused unnecessary test fails.
The option to not open plot windows during test is set. It improves
speed of test and avoids display clutter.
Signed-off-by: Seppo Ingalsuo <seppo.ingalsuo@linux.intel.com>
Seppo Ingalsuo